| Call No. | TH WN 660 D37 2006 |  | ||||
| Title | Assessing the reliability of film and semiconductor detector in measurement of central axis depth dose of electron beams | |||||
| Author |
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| Subject |
| Place | Nakorn Pathom | |||
| Publisher | Faculty of graduate studies, Mahidol University | |||||
| Edition | ||||||
| Year | 2006 | |||||
| Page | 55 p. | |||||
| ISBN | 974-04-7880-8 | |||||
| Type of Material | วิทยานิพนธ์ ภาษาต่างประเทศ | |||||
| Note | The Degree of master of science (Medical physics) | |||||
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| Daranee Piriyasang.(2006).Assessing the reliability of film and semiconductor detector in measurement of central axis depth dose of electron beams.Nakorn Pathom:Faculty of graduate studies, Mahidol University. |
| Call No. | Acc. No. | Location/Collection | Status | Due Date | Reservation |
| TH WN 660 D37 2006 | F014172 | ศูนย์วิทยบริการฯ ชั้น 2 | ON SHELVES |